The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...

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Optical characterisation of thin films is a critical field that bridges fundamental research and application in materials science and engineering. It encompasses the use of various spectroscopic ...

(Nanowerk News) Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, ...

Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, these materials ...

Researchers typically use Raman spectroscopy to check the structural quality and thickness of graphene, but because the technique can only cover a small area in a given time, it’s painfully slow. It ...

Optical microscopy has long served as a fundamental tool in the visualisation of intricate structures across biological, materials and industrial research. Recent advancements in metrology techniques ...

Scientists from Skoltech and their colleagues from Russia and Finland have figured out a non-invasive way to measure the thickness of single-walled carbon nanotube films, which may find applications ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Accurion EP4, the latest imaging ...