Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

Regardless of the test methodology employed, the goal of manufacturing test is to identify, or screen out, defective devices before they are embedded into a system or shipped to the end customer. More ...

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

For testing complex chip designs it makes sense to combine the two most common test methodologies -logic built-in self-test (LBIST) and automatic test pattern generation (ATPG), writes Amer ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Physical defects like shorts and opens may occur during any step of the fabrication process. Well-known fault models like stuck-at (SA), 1 transition (TR), 2 N-detect (ND), 3 gate-exhaustive (GE), 4 ...

MOUNTAIN VIEW, Calif. -- Oct. 5, 2015 -- Synopsys, Inc. (Nasdaq: SNPS) today announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25 percent fewer test ...