In the semiconductor manufacturing industry, damage and yield losses attributed to the effects of static charges are well documented along with the determination of many of the specific causes. 1 If ...

AUSTIN, Texas--(BUSINESS WIRE)--The Silicon Integration Initiative Compact Model Coalition is proud to announce the release of the ASM-ESD diode model, a new electrostatic discharge compact modeling ...

Protection against ESD events (commonly referred to as ESD robustness) is an extremely important aspect of integrated circuit (IC) design and verification, including 2.5/3D designs. ESD events cause ...

Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...