Comparing die test results with other die on a wafer helps identify outliers, but combining that data with the exact location of an outlier offers a much deeper understanding of what can go wrong and ...

Previous work by Gentleman and Wilk on outliers in two-way tables is summarized, and their statistic Q K is discussed. Instead of a plot of Q K values, we propose a two-stage test for the presence of ...

Journal of Applied Econometrics, Vol. 14, No. 5 (Sep. - Oct., 1999), pp. 539-562 (24 pages) In this paper we investigate the properties of the Lagrange Multiplier [LM] test for autoregressive ...

Click to share on Facebook (Opens in new window) Click to share on X (Opens in new window) Click to email a link to a friend (Opens in new window) Click to share on LinkedIn (Opens in new window) Rep.